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Electrostatic Discharge Protection: Advances and Applications

作者: Juin J. Liou 出版社: CRC Press
ISBN: 9781482255881分类号: TN43 /E38
出版时间: 2015-09-25有255人浏览

【内容简介】

Electrostatic discharge (ESD) is one of the most prevalent threats to electronic components. In an ESD event, a finite amount of charge is transferred from one object (i.e., human body) to another (i.e., microchip). This process can result in a very high current passing through the microchip within a very short period of time. Thus, more than 35 percent of single-event chip damages can be attributed to ESD events, and designing ESD structures to protect integrated circuits against the ESD stresses is a high priority in the semiconductor industry.

Electrostatic Discharge Protection: Advances and Applications delivers timely coverage of component- and system-level ESD protection for semiconductor devices and integrated circuits. Bringing together contributions from internationally respected researchers and engineers with expertise in ESD design, optimization, modeling, simulation, and characterization, this book bridges the gap between theory and practice to offer valuable insight into the state of the art of ESD protection.

Amply illustrated with tables, figures, and case studies, the text:

  • Instills a deeper understanding of ESD events and ESD protection design principles
  • Examines vital processes including Si CMOS, Si BCD, Si SOI, and GaN technologies
  • Addresses important aspects pertinent to the modeling and simulation of ESD protection solutions

Electrostatic Discharge Protection: Advances and Applicationsprovides a single source for cutting-edge information vital to the research and development of effective, robust ESD protection solutions for semiconductor devices and integrated circuits.

 

【目录】

 

Introduction to Electrostatic Discharge Protection
Juin J. Liou

Design of Component-Level On-Chip ESD Protection for Integrated Circuits
Charvaka Duvvury
ESD and EOS: Failure Mechanisms and Reliability
Nathaniel Peachey and Kevin Mello
ESD, EOS, and Latch-Up Test Methods and Associated Reliability Concerns
Alan W. Righter
Design of Power-Rail ESD Clamp Circuits with Gate-Leakage Consideration in Nanoscale CMOS Technology
Ming-Dou Ker and Chih-Ting Yeh
ESD Protection in Automotive Integrated Circuit Applications
Javier A. Salcedo and Jean-Jacques Hajjar
ESD Sensitivity of GaN-Based Electronic Devices
Gaudenzio Meneghesso, Matteo Meneghini, and Enrico Zanoni
ESD Protection Circuits Using NMOS Parasitic Bipolar Transistor
Teruo Suzuki
ESD Development in Foundry Processes
Jim Vinson
Compact Modeling of Semiconductor Devices for Electrostatic Discharge Protection Applications
Zhenghao Gan and Waisum Wong
Advanced TCAD Methods for System-Level ESD Design
Vladislav A. Vashchenko and Andrei A. Shibkov
ESD Protection of Failsafe and Voltage-Tolerant Signal Pins
David L. Catlett, Jr., Roger A. Cline, and Ponnarith Pok
ESD Design and Optimization in Advanced CMOS SOI Technology
You Li

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